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TEM / SEM Sample Preparation Systems

  • Simultaneously cleans TEM and SEM specimens and specimen holders
  • Enhances imaging and analytical results
  • Fast
  • Prevents contamination
  • Removes any existing carbonaceous contamination
  • Oil-free vacuum system
  • No etching or sputtering
  • Easy-to-use
  • Storage in clean vacuum
  • Ultra-low energy ion source
  • Concentrated ion beam
  • Removes amorphous and implanted layers
  • Post-FIB processing and milling of conventionally prepared specimens
  • LN2 cooled specimen stage
  • Two independently adjustable TrueFocus ion sources with independently adjustable beam
  • High-energy operation for rapid milling; low-energy operation for sample polishing
  • Adjustable milling angle range of 0° to 10°
  • Sample rocking or rotation
  • Microscope and camera options