Nano Particles Analysis Systems
- Precision ion milling and polishing system for TEM specimens
- 0° to 45° milling angle range
- LN2 specimen cooling to eliminate artifacts
- Variable energy milling
- Fully programmable, easy-to-use
- Adjustable rocking angle for XTEM samples
- Oil-free vacuum system
- Simultaneously cleans TEM and SEM specimens and specimen holders
- Enhances imaging and analytical results
- Fast
- Prevents contamination
- Removes any existing carbonaceous contamination
- Oil-free vacuum system
- No etching or sputtering
- Easy-to-use
- Storage in clean vacuum
- Ultra-low energy ion source
- Concentrated ion beam
- Removes amorphous and implanted layers
- Post-FIB processing and milling of conventionally prepared specimens
- LN2 cooled specimen stage